[IEEE 2009 10th International Conferene on Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Delft, The Netherlands (2009.04.26-2009.04.29)] EuroSimE 2009 - 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Prognostics and condition monitoring of electronics
Lall, Pradeep; Gupta, Prashant; Panchagade, Dhananjay; Kulkarni, Manish; Suhling, Jeff; Hofmeister, James
- 作者Lall, Pradeep; Gupta, Prashant; Panchagade, Dhananjay; Kulkarni, Manish; Suhling, Jeff; Hofmeister, James
- 文件大小22498.45KB
- 发表时间2009
- DOI10.1109/esime.2009.4938486
- 页码1-14