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[IEEE 2009 IEEE 8th International Conference on ASIC (ASICON) - Changsha, Hunan, China (2009.10.20-2009.10.23)] 2009 IEEE 8th International Conference on ASIC - Automatic configuration generation for a SOC co-verification technology based FPGA functional test system

[IEEE 2009 IEEE 8th International Conference on ASIC (ASICON) - Changsha, Hunan, China (2009.10.20-2009.10.23)] 2009 IEEE 8th International Conference on ASIC - Automatic configuration generation for a SOC co-verification technology based FPGA functional test system

Ruan, A.W.; Liao, Y.B.; Li, P.; Li, W.; Li, W.C.
  • 作者Ruan, A.W.; Liao, Y.B.; Li, P.; Li, W.; Li, W.C.
  • 文件大小5129.16KB
  • 发表时间2009
  • DOI10.1109/asicon.2009.5351358
  • 页码605-608
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