$Erratum to “Infrared spectroscopy and X-ray diffraction studies on the crystallographic evolution of La2O3 films upon annealing” Microelectronic Engineering 85 (2008) 2411–2413$

Erratum to “Infrared spectroscopy and X-ray diffraction studies on the crystallographic evolution of La2O3 films upon annealing” Microelectronic Engineering 85 (2008) 2411–2413

D. Tsoutsou; G. Scarel; A. Debernardi; S.C. Capelli; S.N. Volkos; L. Lamagna; S. Schamm; P.E. Coulon; M. Fanciulli

作者D. Tsoutsou; G. Scarel; A. Debernardi; S.C. Capelli; S.N. Volkos; L. Lamagna; S. Schamm; P.E. Coulon; M. Fanciulli
卷第86卷
期第10期
印刷ISSN0167-9317
文件大小161.37KB
发表时间2009
DOI10.1016/j.mee.2008.12.062

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Erratum to “Infrared spectroscopy and X-ray diffraction studies on the crystallographic evolution of La2O3 films upon annealing” Microelectronic Engineering 85 (2008) 2411–2413