Reliability of High-Temperature Operation for GaN-Based OPAMP
Nomoto, Kazuki; Hasegawa, Kazuya; Satoh, Masataka; Nakamura, Tohru
- 期刊名称MRS Proceedings
- 作者Nomoto, Kazuki; Hasegawa, Kazuya; Satoh, Masataka; Nakamura, Tohru
- 卷第1195卷
- 电子ISSN1946-4274
- 文件大小194.77KB
- 发表时间2009-1
- DOI10.1557/PROC-1195-B08-02