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[ACM Press the 42nd Annual IEEE/ACM International Symposium - New York, New York (2009.12.12-2009.12.16)] Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture - Micro-42 - Characterizing and mitigating the impact of process variations on phase change based memory systems

[ACM Press the 42nd Annual IEEE/ACM International Symposium - New York, New York (2009.12.12-2009.12.16)] Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture - Micro-42 - Characterizing and mitigating the impact of process variations on phase change based memory systems

Zhang, Wangyuan; Li, Tao
  • 作者Zhang, Wangyuan; Li, Tao
  • 文件大小1165.22KB
  • 发表时间2009
  • DOI10.1145/1669112.1669116
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