SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Simple method for the measurement of small wavelength differences by optical activity of cholesteric liquid crystal and heterodyne interferometer

Chen, Jing-Heng; Lehmann, Peter H.; Chen, Kun-Huang; Lin, Jiun-You; Hsieh, Hsiang-Yung; Chang, Wei-Yao

作者Chen, Jing-Heng; Lehmann, Peter H.; Chen, Kun-Huang; Lin, Jiun-You; Hsieh, Hsiang-Yung; Chang, Wei-Yao
卷第7389卷
印刷ISSN0277-786X
文件大小267.52KB
发表时间2009
DOI10.1117/12.826846

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