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[IEEE 2009 International Conference on Test and Measurement (ICTM) - Hong Kong, Hong Kong (2009.12.5-2009.12.6)] 2009 International Conference on Test and Measurement - Research of fault diagnosis system for pickling and cold-rolling electric drives based on BP neural network

[IEEE 2009 International Conference on Test and Measurement (ICTM) - Hong Kong, Hong Kong (2009.12.5-2009.12.6)] 2009 International Conference on Test and Measurement - Research of fault diagnosis system for pickling and cold-rolling electric drives based on BP neural network

Yanbin Sun, ; Yi An,
  • 作者Yanbin Sun, ; Yi An,
  • 文件大小829.67KB
  • 发表时间2009
  • DOI10.1109/ictm.2009.5412971
  • 页码161-164
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