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SPIE Proceedings [SPIE SPIE Scanning Microscopy - Monterey, CA (Monday 4 May 2009)] Scanning Microscopy 2009 - Enabling accurate gate profile control with inline 3D-AFM

SPIE Proceedings [SPIE SPIE Scanning Microscopy - Monterey, CA (Monday 4 May 2009)] Scanning Microscopy 2009 - Enabling accurate gate profile control with inline 3D-AFM

Bao, Tianming; Postek, Michael T.; Lopez, Andrew; Newbury, Dale E.; Platek, S. Frank; Dawson, Dean; Joy, David C.
  • 作者Bao, Tianming; Postek, Michael T.; Lopez, Andrew; Newbury, Dale E.; Platek, S. Frank; Dawson, Dean; Joy, David C.
  • 卷第7378卷
  • 印刷ISSN0277-786X
  • 文件大小712.27KB
  • 发表时间2009
  • DOI10.1117/12.824203
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