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Guest Editorial: Reliability, Packaging, Testing, and Characterization of MEMS and MOEMS

Guest Editorial: Reliability, Packaging, Testing, and Characterization of MEMS and MOEMS

Hartzell, Allyson L.
  • 期刊名称Journal of Micro/Nanolithography, MEMS, and MOEMS
  • 作者Hartzell, Allyson L.
  • 卷第8卷
  • 期第3期
  • 印刷ISSN1932-5150
  • 文件大小26.11KB
  • 发表时间2009-07-01
  • DOI10.1117/1.3236753
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