![[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Spectroscopic analysis of trap assisted tunneling in thin oxides by means of substrate hot electron injection experiments]()
[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Spectroscopic analysis of trap assisted tunneling in thin oxides by means of substrate hot electron injection experimentsDriussi, F.; Iob, R.; Esseni, D.; Selmi, L.; van Schaijk, R.; Widdershoven, F. · 2002