SPIE Proceedings [SPIE SPIE MOEMS-MEMS: Micro- and Nanofabrication - San Jose, CA (Saturday 24 January 2009)] Advanced Fabrication Technologies for Micro/Nano Optics and Photonics II - Ultrafast response of negative index metamaterials in the near-infrared
Cho, David J.; Suleski, Thomas J.; Schoenfeld, Winston V.; Wu, Wei; Ponizovskaya, Ekaterina; Wang, Jian J.; Chaturvedi, Pratik; Bratkovksy, Alexander M.; Wang, Shih-Yuan; Zhang, Xiang; Wang, Feng; Shen, Y. Ron
- 作者Cho, David J.; Suleski, Thomas J.; Schoenfeld, Winston V.; Wu, Wei; Ponizovskaya, Ekaterina; Wang, Jian J.; Chaturvedi, Pratik; Bratkovksy, Alexander M.; Wang, Shih-Yuan; Zhang, Xiang; Wang, Feng; Shen, Y. Ron
- 卷第7205卷
- 印刷ISSN0277-786X
- 文件大小350.46KB
- 发表时间2009
- DOI10.1117/12.808455