Test Points Selection for Analog Fault Dictionary Techniques
- 作者Chenglin Yang; Shulin Tian; Bing Long
- 卷第25卷
- 印刷ISSN0923-8174
- 电子ISSN1573-0727
- 文件大小277.27KB
- 发表时间2009-06
- DOI10.1007/s10836-008-5097-8
- 页码157-168
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