Correlation between the defect structure and the residual stress distribution in ZnO visualized by TEM and Raman microscopy

• 作者Thomas Wermelinger; Flavio C.F. Mornaghini; Christian Hinderling; Ralph Spolenak
• 卷第64卷
• 期第1期
• 印刷ISSN0167-577X
• 文件大小1179.22KB
• 发表时间2010
• DOI10.1016/j.matlet.2009.09.061
• 页码28-30