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[IEEE 2010 17th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2010) - Athens, Greece (2010.12.12-2010.12.15)] 2010 17th IEEE International Conference on Electronics, Circuits and Systems - DFTT: Design for Trojan Test

[IEEE 2010 17th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2010) - Athens, Greece (2010.12.12-2010.12.15)] 2010 17th IEEE International Conference on Electronics, Circuits and Systems - DFTT: Design for Trojan Test

Jin, Yier; Kupp, Nathan; Makris, Yiorgos

作者Jin, Yier; Kupp, Nathan; Makris, Yiorgos
文件大小532.05KB
发表时间2010
DOI10.1109/icecs.2010.5724725
页码1168-1171

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