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SPIE Proceedings [SPIE Remote Sensing - Toulouse, France (Monday 20 September 2010)] SAR Image Analysis, Modeling, and Techniques X - <title>Correction of cardinal effects in high resolution SAR imagery</title>

SPIE Proceedings [SPIE Remote Sensing - Toulouse, France (Monday 20 September 2010)] SAR Image Analysis, Modeling, and Techniques X - Correction of cardinal effects in high resolution SAR imagery

Dubois, David; Hardy, Stéphane; Lepage, Richard; Notarnicola, Claudia

作者Dubois, David; Hardy, Stéphane; Lepage, Richard; Notarnicola, Claudia
卷第7829卷
印刷ISSN0277-786X
文件大小5816.73KB
发表时间2010
DOI10.1117/12.865035

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