Decisive factors affecting plasma resistance and roughness formation in ArF photoresist
Jinnai, Butsurin; Uesugi, Takuji; Koyama, Koji; Kato, Keisuke; Yasuda, Atsushi; Maeda, Shinichi; Momose, Hikaru; Samukawa, Seiji
- 期刊名称Journal of Physics D: Applied Physics
- 作者Jinnai, Butsurin; Uesugi, Takuji; Koyama, Koji; Kato, Keisuke; Yasuda, Atsushi; Maeda, Shinichi; Momose, Hikaru; Samukawa, Seiji
- 卷第43卷
- 期第39期
- 印刷ISSN0022-3727
- 电子ISSN1361-6463
- 文件大小620.70KB
- 发表时间2010-10-06
- DOI10.1088/0022-3727/43/39/395204