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[IEEE 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2010.06.1-2010.06.4)] 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - Modeling for defects impact on electrical performance of power packages

[IEEE 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2010.06.1-2010.06.4)] 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - Modeling for defects impact on electrical performance of power packages

Liu, Yumin; Wu, Chung-Lin; Liu, Yong; Kinzer, Dan; Jeon, O S

作者Liu, Yumin; Wu, Chung-Lin; Liu, Yong; Kinzer, Dan; Jeon, O S
文件大小1405.17KB
发表时间2010
DOI10.1109/ECTC.2010.5490942
页码403-410

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