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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Environmental monitoring in grain

[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Environmental monitoring in grain

Parkinson, Graham; Crutchley, Dominic; Green, Peter M; Antoniou, Michalis; Boon, Mathew; Green, Peter N.; Green, Peter R.; Sloan, Robin; York, Trevor
  • 作者Parkinson, Graham; Crutchley, Dominic; Green, Peter M; Antoniou, Michalis; Boon, Mathew; Green, Peter N.; Green, Peter R.; Sloan, Robin; York, Trevor
  • 文件大小970.45KB
  • 发表时间2010
  • DOI10.1109/IMTC.2010.5488046
  • 页码939-943
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