X-Ray Diffraction Microscopy
- 期刊名称Annual Review of Condensed Matter Physics
- 作者Thibault, Pierre; Elser, Veit
- 卷第1卷
- 期第1期
- 印刷ISSN1947-5454
- 电子ISSN1947-5462
- 文件大小4192.80KB
- 发表时间2010-08-10
- DOI10.1146/annurev-conmatphys-070909-104034
- 页码237-255
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