Experimental Assessment of Electrons and Holes in Erase Transient of TANOS and TANVaS Memories
Suhane, Amit; Arreghini, Antonio; Van den bosch, Geert; Vandelli, Luca; Padovani, Andrea; Breuil, Laurent; Larcher, Luca; De Meyer, Kristin; Van Houdt, Jan
- 期刊名称IEEE Electron Device Letters
- 作者Suhane, Amit; Arreghini, Antonio; Van den bosch, Geert; Vandelli, Luca; Padovani, Andrea; Breuil, Laurent; Larcher, Luca; De Meyer, Kristin; Van Houdt, Jan
- 卷第31卷
- 期第9期
- 印刷ISSN0741-3106
- 电子ISSN1558-0563
- 文件大小434.13KB
- 发表时间2010-09
- DOI10.1109/led.2010.2055824
- 页码936-938