[IEEE 2010 IEEE International Memory Workshop - Seoul, Korea (South) (2010.05.16-2010.05.19)] 2010 IEEE International Memory Workshop - Highly-scalable disruptive reading scheme for Gb-scale SPRAM and beyond
Takemura, R.; Kawahara, T.; Ono, K.; Miura, K.; Matsuoka, H.; Ohno, H.
- 作者Takemura, R.; Kawahara, T.; Ono, K.; Miura, K.; Matsuoka, H.; Ohno, H.
- 文件大小304.49KB
- 发表时间2010
- DOI10.1109/imw.2010.5488324
- 页码1-2