[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Ring oscillator based embedded structure for decoupling PMOS/NMOS degradation with switching activity replication
- 作者Ahmed, Fahad; Milor, Linda
- 文件大小346.83KB
- 发表时间2010
- DOI10.1109/icmts.2010.5466845
- 页码118-121
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