[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Design of excitation signals for nonparametric measurements on MIMO-systems in the presence of nonlinear distortions
Schoukens, J.; Pintelon, R.; Vandersteen, G.; Rolain, Y.
- 作者Schoukens, J.; Pintelon, R.; Vandersteen, G.; Rolain, Y.
- 文件大小636.22KB
- 发表时间2010
- DOI10.1109/imtc.2010.5488297
- 页码1-5