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Introducing 65 nm CMOS technology in low-noise read-out of semiconductor detectors

Introducing 65 nm CMOS technology in low-noise read-out of semiconductor detectors

M. Manghisoni; L. Gaioni; L. Ratti; V. Re; G. Traversi

作者M. Manghisoni; L. Gaioni; L. Ratti; V. Re; G. Traversi
卷第624卷
期第2期
印刷ISSN0168-9002
文件大小1094.66KB
发表时间2010
DOI10.1016/j.nima.2010.02.266
页码373-378

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