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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Shadow checker (SC): A low-cost hardware scheme for online detection of faults in small memory structures of a microprocessor

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Shadow checker (SC): A low-cost hardware scheme for online detection of faults in small memory structures of a microprocessor

Rodrigues, Rance; Kundu, Sandip; Khan, Omer

作者Rodrigues, Rance; Kundu, Sandip; Khan, Omer
文件大小2043.81KB
发表时间2010
DOI10.1109/test.2010.5699222
页码1-10

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