The reliability of multi-parameter insulation diagnosis
- 期刊名称IEEE Transactions on Dielectrics and Electrical Insulation
- 作者Wu, Kai; Shen, Wei; Meng, Yongpeng; Cao, Wen; Pan, Cheng; Cheng, Yonghong; Zhang, Xiaohong
- 卷第17卷
- 期第1期
- 印刷ISSN1070-9878
- 文件大小474.16KB
- 发表时间2010-02
- DOI10.1109/tdei.2010.5412028
- 页码280-286
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