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[IEEE 2010 23rd Annual Meeting of the IEEE Photonics Society (Formerly LEOS Annual Meeting) - Denver, CO, USA (2010.11.7-2010.11.11)] 2010 IEEE Photinic Society's 23rd Annual Meeting - Stress analysis in copper plated red VCSELs

[IEEE 2010 23rd Annual Meeting of the IEEE Photonics Society (Formerly LEOS Annual Meeting) - Denver, CO, USA (2010.11.7-2010.11.11)] 2010 IEEE Photinic Society's 23rd Annual Meeting - Stress analysis in copper plated red VCSELs

Safaisini, Rashid; Johnson, Klein; Hibbs-Brenner, Mary; Lear, Kevin L.

作者Safaisini, Rashid; Johnson, Klein; Hibbs-Brenner, Mary; Lear, Kevin L.
文件大小192.41KB
发表时间2010
DOI10.1109/photonics.2010.5698851
页码246-247

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