Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization
- 期刊名称Review of Scientific Instruments
- 作者Zhang, Lan; Ju, Yang; Hosoi, Atsushi; Fujimoto, Akifumi
- 卷第81卷
- 期第12期
- 印刷ISSN0034-6748
- 文件大小678.98KB
- 发表时间2010
- DOI10.1063/1.3525058
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