A Novel Method for In Situ Uniaxial Tests at the Micro/Nano Scale—Part I: Theory
Kang, Wonmo; Saif, M. Taher A.
- 期刊名称Journal of Microelectromechanical Systems
- 作者Kang, Wonmo; Saif, M. Taher A.
- 卷第19卷
- 期第6期
- 印刷ISSN1057-7157
- 电子ISSN1941-0158
- 文件大小1545.51KB
- 发表时间2010-12
- DOI10.1109/jmems.2010.2076779
- 页码1309-1321