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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - A new method for estimating spectral performance of ADC from INL

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - A new method for estimating spectral performance of ADC from INL

Duan, Jingbo; Jin, Le; Chen, Degang
  • 作者Duan, Jingbo; Jin, Le; Chen, Degang
  • 文件大小274.44KB
  • 发表时间2010
  • DOI10.1109/test.2010.5699273
  • 页码1-10
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