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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - A testing system for the performance evaluation of electrical machines under realistic voltage fluctuations

[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - A testing system for the performance evaluation of electrical machines under realistic voltage fluctuations

Bucci, G.; Fiorucci, E.; Ciancetta, F.; Rotondale, N.

作者Bucci, G.; Fiorucci, E.; Ciancetta, F.; Rotondale, N.
文件大小1017.50KB
发表时间2010
DOI10.1109/imtc.2010.5488191
页码1441-1446

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