Backtesting Stochastic Mortality Models
- 期刊名称North American Actuarial Journal
- 作者Dowd, Kevin; Cairns, Andrew J. G.; Blake, David; Coughlan, Guy D.; Epstein, David; Khalaf-Allah, Marwa
- 卷第14卷
- 期第3期
- 印刷ISSN1092-0277
- 电子ISSN2325-0453
- 文件大小400.55KB
- 发表时间2010-07
- DOI10.1080/10920277.2010.10597592
- 页码281-298
[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (2003.12.10-2003.12.10)] IEEE International Electron Devices Meeting 2003 - IEEE International Electron Devices Meeting 20032003
[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (2004.12.13-2004.12.15)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - IEEE International Electron Devices Meeting - IEDM - Cover2004
[IEEE Proceedings of 1994 IEEE International Electron Devices Meeting - San Francisco, CA, USA (1994.12.11-1994.12.14)] Proceedings of 1994 IEEE International Electron Devices Meeting IEDM-94 - Proceedings of 1994 IEEE International Electron Devices Meeting1994
[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - Emerging Technologies - Energy Harvesting Electron DevicesWhite, Bruce · 2007
[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (2004.12.13-2004.12.15)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - 2004 International Electron Devices Meeting (IEEE Cat. No.04CH37602)2004
[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (2004.12.13-2004.12.15)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - IEEE International Electron Devices Meeting 2004 - IEDM Technical Digest - Title2004
[IEEE Proceedings of IEEE International Electron Devices Meeting - San Francisco, CA, USA (1992.12.13-1992.12.16)] 1992 International Technical Digest on Electron Devices Meeting - Proceedings of IEEE International Electron Devices Meeting [Front Cover]1992
[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - CMOS Devices - High-Performance DevicesNatarajan, Sanjay; Steegen, An · 2007