Specific features of formation and propagation of 60° and 90° misfit dislocations in GexSi1−x/Si films with x>0.4

• 作者Yu.B. Bolkhovityanov; A.S. Deryabin; A.K. Gutakovskii; L.V. Sokolov
• 卷第312卷
• 期第21期
• 印刷ISSN0022-0248
• 文件大小973.03KB
• 发表时间2010
• DOI10.1016/j.jcrysgro.2010.07.041
• 页码3080-3084