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Forecasting noise and radiation hardness of CMOS front-end electronics beyond the 100 nm frontier

Forecasting noise and radiation hardness of CMOS front-end electronics beyond the 100 nm frontier

V. Re; L. Gaioni; M. Manghisoni; L. Ratti; G. Traversi

作者V. Re; L. Gaioni; M. Manghisoni; L. Ratti; G. Traversi
卷第617卷
印刷ISSN0168-9002
文件大小494.77KB
发表时间2010
DOI10.1016/j.nima.2009.09.098
页码358-361

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