Exploiting Critical Path Method for Evaluation of Conceptual Design
Wang, Mei Yan; Shen, Lian Guan; Deng, Yi Min
- 期刊名称Advanced Materials Research
- 作者Wang, Mei Yan; Shen, Lian Guan; Deng, Yi Min
- 电子ISSN1662-8985
- 文件大小301.47KB
- 发表时间2010-3
- DOI10.4028/www.scientific.net/AMR.97-101.4429
- 页码4429-4432