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Microstructural characterization of materials by neural network technique

Microstructural characterization of materials by neural network technique

P. Barat; A. Chatterjee; P. Mukherjee; N. Gayathri; T. Jayakumar; Baldev Raj
  • 作者P. Barat; A. Chatterjee; P. Mukherjee; N. Gayathri; T. Jayakumar; Baldev Raj
  • 卷第375卷
  • 期第1期
  • 印刷ISSN0375-9601
  • 文件大小169.52KB
  • 发表时间2010
  • DOI10.1016/j.physleta.2010.10.023
  • 页码6-10
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