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Improved reliability modeling using Bayesian networks and dynamic discretization

Improved reliability modeling using Bayesian networks and dynamic discretization

David Marquez; Martin Neil; Norman Fenton

作者David Marquez; Martin Neil; Norman Fenton
卷第95卷
期第4期
印刷ISSN0951-8320
文件大小914.10KB
发表时间2010
DOI10.1016/j.ress.2009.11.012
页码412-425

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