Performance, reliability, radiation effects, and aging issues in microelectronics – From atomic-scale physics to engineering-level modeling
- 作者Sokrates T. Pantelides; L. Tsetseris; M.J. Beck; S.N. Rashkeev; G. Hadjisavvas; I.G. Batyrev; B.R. Tuttle; A.G. Marinopoulos; X.J. Zhou; D.M. Fleetwood; R.D. Schrimpf
- 卷第54卷
- 期第9期
- 印刷ISSN0038-1101
- 文件大小1188.90KB
- 发表时间2010
- DOI10.1016/j.sse.2010.04.041
- 页码841-848
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