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On the measurement of thickness in nanoporous materials by EELS

On the measurement of thickness in nanoporous materials by EELS

Nan Jiang; Dong Su; John C.H. Spence

作者Nan Jiang; Dong Su; John C.H. Spence
卷第111卷
期第1期
印刷ISSN0304-3991
文件大小405.42KB
发表时间2010
DOI10.1016/j.ultramic.2010.09.011
页码62-65

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