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[ACM Press the 16th ACM/IEEE international symposium - Austin, Texas, USA (2010.08.18-2010.08.20)] Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design - ISLPED '10 - Post-silicon power characterization using thermal infrared emissions

[ACM Press the 16th ACM/IEEE international symposium - Austin, Texas, USA (2010.08.18-2010.08.20)] Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design - ISLPED '10 - Post-silicon power characterization using thermal infrared emissions

Cochran, Ryan; Nowroz, Abdullah Nama; Reda, Sherief
  • 作者Cochran, Ryan; Nowroz, Abdullah Nama; Reda, Sherief
  • 文件大小1119.47KB
  • 发表时间2010
  • DOI10.1145/1840845.1840914
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