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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Radar Sensor Technology XIV - <title>The Rayleigh problem is everywhere!</title>

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Radar Sensor Technology XIV - The Rayleigh problem is everywhere!

Gray, John E.; Addison, Stephen R.; Ranney, Kenneth I.; Doerry, Armin W.

作者Gray, John E.; Addison, Stephen R.; Ranney, Kenneth I.; Doerry, Armin W.
卷第7669卷
印刷ISSN0277-786X
文件大小552.11KB
发表时间2010
DOI10.1117/12.850670

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