High Resolution Secondary-Electron and ADF-STEM Imaging with Hitachi HD2700C Scanning Transmission Electron Microscope
- 期刊名称Microscopy and Microanalysis
- 作者Inada, H; Konno, M; Suzuki, Y; Nakamura, K; Wall, J; Zhu, Y
- 卷第16卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小1488.22KB
- 发表时间2010-7
- DOI10.1017/s1431927610059477
- 页码102-103
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