SPIE Proceedings [SPIE OPTO - San Francisco, California (Saturday 23 January 2010)] Gallium Nitride Materials and Devices V - GaN-based VCSELs: analysis of internal device physics and performance limitations
- 作者Chyi, Jen-Inn; Piprek, Joachim; Li, Simon; Nanishi, Yasushi; Morkoç, Hadis; Litton, Cole W.; Piprek, Joachim; Yoon, Euijoon
- 卷第7602卷
- 印刷ISSN0277-786X
- 文件大小1159.77KB
- 发表时间2010
- DOI10.1117/12.840515
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