Stress test measurements of lattice-matched InAlN/AlN/GaN HFET structures

• 作者Jacob H. Leach; Mo Wu; Xianfeng Ni; Xing Li; Ümit Özgür; Hadis Morkoç; Juozas Liberis; Emilis Šermukšnis; Arvydas Matulionis; Hailing Cheng; Çagliyan Kurdak; Yong-Tae Moon
• 卷第207卷
• 期第6期
• 印刷ISSN1862-6319
• 文件大小184.30KB
• 发表时间2010
• DOI10.1002/pssa.200983556
• 页码1345-1347