![SPIE Proceedings [SPIE SPIE Astronomical Telescopes + Instrumentation - Amsterdam, Netherlands (Sunday 1 July 2012)] Ground-based and Airborne Instrumentation for Astronomy IV - A demonstration test of the dual-beam polarimetry differential imaging system for the high-contrast observation]()
SPIE Proceedings [SPIE SPIE Astronomical Telescopes + Instrumentation - Amsterdam, Netherlands (Sunday 1 July 2012)] Ground-based and Airborne Instrumentation for Astronomy IV - A demonstration test of the dual-beam polarimetry differential imaging system for the high-contrast observationDou, Jiangpei; McLean, Ian S.; Ramsay, Suzanne K.; Ren, Deqing; Zhu, Yongtian; Takami, Hideki; Wang, Xue; Zhang, Xi; Li, Rong · 2012