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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, California (Sunday 17 January 2010)] Intelligent Robots and Computer Vision XXVII: Algorithms and Techniques - N-dimension closeness measurements used in dynamic pattern recognitions

SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, California (Sunday 17 January 2010)] Intelligent Robots and Computer Vision XXVII: Algorithms and Techniques - N-dimension closeness measurements used in dynamic pattern recognitions

Hu, Chialun John; Casasent, David P.; Hall, Ernest L.; Röning, Juha
  • 作者Hu, Chialun John; Casasent, David P.; Hall, Ernest L.; Röning, Juha
  • 卷第7539卷
  • 印刷ISSN0277-786X
  • 文件大小409.43KB
  • 发表时间2010
  • DOI10.1117/12.837107
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