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SPIE Proceedings [SPIE Security + Defence - Toulouse, France (Monday 20 September 2010)] Electro-Optical Remote Sensing, Photonic Technologies, and Applications IV - The manufacturing and testing of Cs 2 Te UV image intensifier

SPIE Proceedings [SPIE Security + Defence - Toulouse, France (Monday 20 September 2010)] Electro-Optical Remote Sensing, Photonic Technologies, and Applications IV - The manufacturing and testing of Cs 2 Te UV image intensifier

Fu, Rongguo; Kamerman, Gary W.; Steinvall, Ove; Chang, Benkang; Qian, Yuansheng; Lewis, Keith L.; Hollins, Richard C.; Qiu, Yafeng; Merlet, Thomas J.; Bishop, Gary J.; Gonglewski, John D.
  • 作者Fu, Rongguo; Kamerman, Gary W.; Steinvall, Ove; Chang, Benkang; Qian, Yuansheng; Lewis, Keith L.; Hollins, Richard C.; Qiu, Yafeng; Merlet, Thomas J.; Bishop, Gary J.; Gonglewski, John D.
  • 卷第7835卷
  • 印刷ISSN0277-786X
  • 文件大小979.74KB
  • 发表时间2010
  • DOI10.1117/12.865514
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