SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Phase shift based measurements using a pocket LCD projector
- 作者Williams, Yana; Harding, Kevin; Huang, Peisen S.; Harding, Kevin; Yoshizawa, Toru
- 卷第7855卷
- 印刷ISSN0277-786X
- 文件大小2137.34KB
- 发表时间2010
- DOI10.1117/12.871214