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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Reflection, Scattering, and Diffraction from Surfaces II - Optical measurement for the concentrations of the pickling acid with near infrared spectroscopy in steel making industry

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Reflection, Scattering, and Diffraction from Surfaces II - Optical measurement for the concentrations of the pickling acid with near infrared spectroscopy in steel making industry

Kang, Gumin; Gu, Zu-Han; Hanssen, Leonard M.; Lee, Kwangchil; Park, Haesung; Lee, Jinho; Jung, Youngjean; Kim, Kyoungsik
  • 作者Kang, Gumin; Gu, Zu-Han; Hanssen, Leonard M.; Lee, Kwangchil; Park, Haesung; Lee, Jinho; Jung, Youngjean; Kim, Kyoungsik
  • 卷第7792卷
  • 印刷ISSN0277-786X
  • 文件大小512.71KB
  • 发表时间2010
  • DOI10.1117/12.860284
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