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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Earth Observing Systems XV - Study of instrument temperature effect on MODIS thermal emissive band responses

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Earth Observing Systems XV - Study of instrument temperature effect on MODIS thermal emissive band responses

Butler, James J.; Chang, Tiejun; Xiong, Xiaoxiong; Xiong, Xiaoxiong; Gu, Xingfa
  • 作者Butler, James J.; Chang, Tiejun; Xiong, Xiaoxiong; Xiong, Xiaoxiong; Gu, Xingfa
  • 卷第7807卷
  • 印刷ISSN0277-786X
  • 文件大小571.91KB
  • 发表时间2010
  • DOI10.1117/12.859717
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